135 search results - page 14 / 27 » Test Generation for Model-Based Diagnosis |
ICST
2009
IEEE
14 years 3 months ago
2009
IEEE
The problem of testing from an extended finite state machine (EFSM) can be expressed in terms of finding suitable paths through the EFSM and then deriving test data to follow the ...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
As the technology is shrinking and the working frequency is going into multi gigahertz range, the issues related to interconnect testing are becoming more dominant. Specifically,...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multipl...
ICBA
2004
Springer
14 years 2 months ago
2004
Springer
Abstract. Current appearance-based face recognition system encounters the difficulty to recognize faces with appearance variations, while only a small number of training images are...