88 search results - page 13 / 18 » Test Selection Based on High Level Fault Simulation for Mixe... |
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...
HPCA
2006
IEEE
14 years 7 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
PPAM
2005
Springer
14 years 28 days ago
2005
Springer
We present a web computing library (PUBWCL) in Java that allows to execute tightly coupled, massively parallel algorithms in the bulk-synchronous (BSP) style on PCs distributed ove...
EDCC
2005
Springer
14 years 1 months ago
2005
Springer
Abstract. The A3M project aimed to define basic building blocks of a middleware meeting both dependability and real-time requirements for a wide range of space systems and applicat...
DSN
2009
IEEE
14 years 2 months ago
2009
IEEE
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...