88 search results - page 13 / 18 » Test Selection Based on High Level Fault Simulation for Mixe... |
133
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ISCAS
2005
IEEE
15 years 10 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...
158
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HPCA
2006
IEEE
16 years 4 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
138
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PPAM
2005
Springer
15 years 10 months ago
2005
Springer
We present a web computing library (PUBWCL) in Java that allows to execute tightly coupled, massively parallel algorithms in the bulk-synchronous (BSP) style on PCs distributed ove...
145
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EDCC
2005
Springer
15 years 10 months ago
2005
Springer
Abstract. The A3M project aimed to define basic building blocks of a middleware meeting both dependability and real-time requirements for a wide range of space systems and applicat...
171
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DSN
2009
IEEE
15 years 11 months ago
2009
IEEE
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...