29 search results - page 4 / 6 » Test compaction for transition faults under transparent-scan |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
PTS
2007
13 years 8 months ago
2007
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...
VTS
2002
IEEE
14 years 5 hour ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
SERA
2007
Springer
14 years 1 months ago
2007
Springer
Robustness is an important feature required for embedded systems. This paper presents a methodology to test robustness of such systems. We investigate system behaviour aspects. We...
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...