Regression test prioritization techniques re-order the execution of a test suite in an attempt to ensure that defects are revealed earlier in the test execution phase. In prior wo...
Matthew J. Rummel, Gregory M. Kapfhammer, Andrew T...
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
Patrick Girard, Christian Landrault, Serge Pravoss...
The problem of fault grading for multiple path delay faults is studied and a method of obtaining the exact coverage is presented. The faults covered are represented and manipulate...
Metamorphic testing has been shown to be a simple yet effective technique in addressing the quality assurance of applications that do not have test oracles, i.e., for which it is ...
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...