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ATS
1998
IEEE
106views Hardware» more  ATS 1998»
15 years 8 months ago
A Test Pattern Generation Algorithm Exploiting Behavioral Information
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
CODES
2005
IEEE
15 years 9 months ago
An architectural level design methodology for embedded face detection
Face detection and recognition research has attracted great attention in recent years. Automatic face detection has great potential in a large array of application areas, includin...
Vida Kianzad, Sankalita Saha, Jason Schlessman, Ga...
IFIP
2001
Springer
15 years 8 months ago
Functional Test Generation using Constraint Logic Programming
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
Zhihong Zeng, Maciej J. Ciesielski, Bruno Rouzeyre
AGILEDC
2006
IEEE
15 years 10 months ago
On Agile Performance Requirements Specification and Testing
Underspecified performance requirements can cause performance issues in a software system. However, a complete, upfront analysis of a software system is difficult, and usually not...
Chih-Wei Ho, Michael J. Johnson, Laurie Williams, ...
VLSID
2004
IEEE
139views VLSI» more  VLSID 2004»
16 years 4 months ago
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
André Ivanov, Baosheng Wang, Josh Yang