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ATS
1998
IEEE
106views Hardware» more  ATS 1998»
14 years 22 days ago
A Test Pattern Generation Algorithm Exploiting Behavioral Information
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
CODES
2005
IEEE
14 years 2 months ago
An architectural level design methodology for embedded face detection
Face detection and recognition research has attracted great attention in recent years. Automatic face detection has great potential in a large array of application areas, includin...
Vida Kianzad, Sankalita Saha, Jason Schlessman, Ga...
IFIP
2001
Springer
14 years 27 days ago
Functional Test Generation using Constraint Logic Programming
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
Zhihong Zeng, Maciej J. Ciesielski, Bruno Rouzeyre
AGILEDC
2006
IEEE
14 years 2 months ago
On Agile Performance Requirements Specification and Testing
Underspecified performance requirements can cause performance issues in a software system. However, a complete, upfront analysis of a software system is difficult, and usually not...
Chih-Wei Ho, Michael J. Johnson, Laurie Williams, ...
VLSID
2004
IEEE
139views VLSI» more  VLSID 2004»
14 years 8 months ago
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
André Ivanov, Baosheng Wang, Josh Yang