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ITC
2002
IEEE
127views Hardware» more  ITC 2002»
15 years 11 months ago
A New Test Generation Approach for Embedded Analogue Cores in SoC
M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T...
GECCO
2009
Springer
209views Optimization» more  GECCO 2009»
15 years 10 months ago
MC/DC automatic test input data generation
Zeina Awedikian, Kamel Ayari, Giuliano Antoniol
ICSE
2009
IEEE-ACM
15 years 10 months ago
Automated Test Program Generation for an Industrial Optimizing Compiler
Chen Zhao, Yunzhi Xue, Qiuming Tao, Liang Guo, Zha...
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FM
2001
Springer
101views Formal Methods» more  FM 2001»
15 years 10 months ago
Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP System
Laurent Arditi, Hédi Boufaïed, Arnaud ...