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search results - page 106 / 1171
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Test generation and minimization with
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ITC
2002
IEEE
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Hardware
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A New Test Generation Approach for Embedded Analogue Cores in SoC
15 years 11 months ago
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doc.utwente.nl
M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T...
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GECCO
2009
Springer
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Optimization
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MC/DC automatic test input data generation
15 years 10 months ago
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squirrel.polymtl.ca
Zeina Awedikian, Kamel Ayari, Giuliano Antoniol
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127
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ICSE
2009
IEEE-ACM
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Software Engineering
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Automated Test Program Generation for an Industrial Optimizing Compiler
15 years 10 months ago
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ast2009.com
Chen Zhao, Yunzhi Xue, Qiuming Tao, Liang Guo, Zha...
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141
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ICSE
2009
IEEE-ACM
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Software Engineering
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The Automated Generation of Test Cases Using an Extended Domain Based Reliability Model
15 years 10 months ago
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ast2009.com
Alberto Avritzer, Elaine J. Weyuker
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FM
2001
Springer
101
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Formal Methods
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Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP System
15 years 10 months ago
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cs.haifa.ac.il
Laurent Arditi, Hédi Boufaïed, Arnaud ...
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