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ATS
2000
IEEE
86views Hardware» more  ATS 2000»
15 years 10 months ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...
114
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ICTAI
2000
IEEE
15 years 10 months ago
A genetic algorithm-based system for generating test programs for microprocessor IP cores
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
ASPDAC
2000
ACM
102views Hardware» more  ASPDAC 2000»
15 years 10 months ago
Causality based generation of directed test cases
Nina Saxena, Jacob A. Abraham, Avijit Saha