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FM
1998
Springer

198views Formal Methods» more FM 1998»

Automated Test Set Generation for Statecharts

15 years 10 months ago

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Kirill Bogdanov, Mike Holcombe, Harbhajan Singh

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123

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GLVLSI
1997
IEEE

92views VLSI» more GLVLSI 1997»

An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation

15 years 10 months ago

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H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...

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116

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GLVLSI
1997
IEEE

92views VLSI» more GLVLSI 1997»

On Generating Test Sets that Remain Valid in the Presence of Undetected Faults

15 years 10 months ago

Download www.cs.york.ac.uk

Irith Pomeranz, Sudhakar M. Reddy

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123

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INFOCOM
1996
IEEE

105views Communications» more INFOCOM 1996»

Context Independent Unique Sequences Generation for Protocol Testing

15 years 10 months ago

Download www.cs.ou.edu

T. Ramalingom, Krishnaiyan Thulasiraman, Anindya D...

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116

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ITC
1996
IEEE

78views Hardware» more ITC 1996»

Identification and Test Generation for Primitive Faults

15 years 10 months ago

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