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106

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ASPDAC
2008
ACM

78views Hardware» more ASPDAC 2008»

Robust test generation for power supply noise induced path delay faults

15 years 8 months ago

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Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li

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121

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ISSTA
2010
ACM

168views Software Engineering» more ISSTA 2010»

Generating test cases for specification mining

15 years 8 months ago

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Valentin Dallmeier, Nikolai Knopp, Christoph Mallo...

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133

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SERP
2007

82views Software Engineering» more SERP 2007»

Random Test Data Generation for Java Classes Annotated with JML Specifications

15 years 7 months ago

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Yoonsik Cheon, Carlos E. Rubio-Medrano

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116

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DAGSTUHL
2004

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Tools for Test Case Generation

15 years 7 months ago

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Axel Belinfante, Lars Frantzen, Christian Schallha...

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DAGSTUHL
2004

81views Software Engineering» more DAGSTUHL 2004»

Test Generation Algorithms Based on Preorder Relations

15 years 7 months ago

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