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COMPUTER
1999

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Current Directions in Automatic Test-Pattern Generation

15 years 5 months ago

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Kwang-Ting Cheng, Angela Krstic

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108

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TODAES
1998

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Functional test generation for delay faults in combinational circuits

15 years 5 months ago

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Irith Pomeranz, Sudhakar M. Reddy

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131

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TSE
1998

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Using Test Oracles Generated from Program Documentation

15 years 5 months ago

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Dennis K. Peters, David Lorge Parnas

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117

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SQJ
2010

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Using program data-state scarcity to guide automatic test data generation

15 years 4 months ago

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Mohammad Alshraideh, Leonardo Bottaci, Basel A. Ma...

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116

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STVR
2010

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Automatic string test data generation for detecting domain errors

15 years 4 months ago

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