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    TODAES
    1998
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    Functional test generation for delay faults in combinational circuits

    14 years 4 days ago
    Functional test generation for delay faults in combinational circuits
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    Irith Pomeranz, Sudhakar M. Reddy
    claim paper
    Added 23 Dec 2010
    Updated 23 Dec 2010
    Type Journal
    Year 1998
    Where TODAES
    Authors Irith Pomeranz, Sudhakar M. Reddy
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