Sciweavers

TODAES
1998

Functional test generation for delay faults in combinational circuits

14 years 3 days ago
Functional test generation for delay faults in combinational circuits
Irith Pomeranz, Sudhakar M. Reddy
Added 23 Dec 2010
Updated 23 Dec 2010
Type Journal
Year 1998
Where TODAES
Authors Irith Pomeranz, Sudhakar M. Reddy
Comments (0)