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79

TODAES
1998

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Functional test generation for delay faults in combinational circuits

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Functional test generation for delay faults in combinational circuits

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Irith Pomeranz, Sudhakar M. Reddy

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TODAES 1998 |

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Added	23 Dec 2010
Updated	23 Dec 2010
Type	Journal
Year	1998
Where	TODAES
Authors	Irith Pomeranz, Sudhakar M. Reddy

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