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VTS
2002
IEEE
113views Hardware» more  VTS 2002»
14 years 18 days ago
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
Krishna Sekar, Sujit Dey
ISSRE
2003
IEEE
14 years 29 days ago
Exploiting Symmetries to Test Programs
Symmetries often appear as properties of many artifical settings. In Program Testing, they can be viewed as properties of programs and can be given by the tester to check the cor...
Arnaud Gotlieb
ITC
2000
IEEE
124views Hardware» more  ITC 2000»
14 years 2 days ago
Wrapper design for embedded core test
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...
Yervant Zorian, Erik Jan Marinissen, Maurice Lousb...
ICSE
2007
IEEE-ACM
14 years 7 months ago
Randomized Differential Testing as a Prelude to Formal Verification
Most flight software testing at the Jet Propulsion Laboratory relies on the use of hand-produced test scenarios and is executed on systems as similar as possible to actual mission...
Alex Groce, Gerard J. Holzmann, Rajeev Joshi
VTS
2003
IEEE
115views Hardware» more  VTS 2003»
14 years 29 days ago
Fault Testing for Reversible Circuits
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
Ketan N. Patel, John P. Hayes, Igor L. Markov