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DATE
2002
IEEE
98views Hardware» more  DATE 2002»
14 years 20 days ago
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael ...
ATS
2009
IEEE
99views Hardware» more  ATS 2009»
14 years 2 months ago
Test Generation for Designs with On-Chip Clock Generators
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...
Xijiang Lin, Mark Kassab
LWA
2004
13 years 9 months ago
Modeling Rule Precision
This paper reports first results of an empirical study of the precision of classification rules on an independent test set. We generated a large number of rules using a general co...
Johannes Fürnkranz
ISSTA
2004
ACM
14 years 1 months ago
Optimal strategies for testing nondeterministic systems
This paper deals with testing of nondeterministic software systems. We assume that a model of the nondeterministic system is given by a directed graph with two kind of vertices: s...
Lev Nachmanson, Margus Veanes, Wolfram Schulte, Ni...
TMI
2008
154views more  TMI 2008»
13 years 7 months ago
Brain Anatomical Structure Segmentation by Hybrid Discriminative/Generative Models
In this paper, a hybrid discriminative/generative model for brain anatomical structure segmentation is proposed. The learning aspect of the approach is emphasized. In the discrimin...
Zhuowen Tu, Katherine Narr, Piotr Dollár, I...