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DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
ISCAS
1995
IEEE
13 years 11 months ago
1995
IEEE
: Configurations of adders and registers, which are available in tnany datapaths, can be utilized to generate pattems and to compact test responses. Thispaper unalyzes tlie patiern...
ACMSE
2006
ACM
14 years 1 months ago
2006
ACM
Like in other fields, computer products (applications, hardware, etc.), before being marketed, require some level of testing to verify whether they meet their design and function...
ISSRE
2008
IEEE
14 years 2 months ago
2008
IEEE
We present a novel specification-based approach for generating tests for products in a software product line. Given properties of features as first-order logic formulas, our app...
KES
2008
Springer
13 years 7 months ago
2008
Springer
Software testing is an integral part of software engineering. Lack of testing often leads to disastrous consequences including loss of data, fortunes, and even lives. In order to e...