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VTS
2002
IEEE
14 years 19 days ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
ETS
2009
IEEE
13 years 5 months ago
2009
IEEE
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
IWANN
2009
Springer
14 years 2 months ago
2009
Springer
Frequently, the number of input variables (features) involved in a problem becomes too large to be easily handled by conventional machine-learning models. This paper introduces a c...
SIGIR
2006
ACM
14 years 1 months ago
2006
ACM
Accurate estimation of information retrieval evaluation metrics such as average precision require large sets of relevance judgments. Building sets large enough for evaluation of r...
SDM
2010
SIAM
13 years 9 months ago
2010
SIAM
We present Confidence-based Feature Acquisition (CFA), a novel supervised learning method for acquiring missing feature values when there is missing data at both training and test...