5855 search results - page 8 / 1171 » Test generation and minimization with |
ENTCS
2007
13 years 7 months ago
2007
Several model-checker based methods to automated test-case generation have been proposed recently. The performance and applicability largely depends on the complexity of the model...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
COMSWARE
2008
IEEE
14 years 2 months ago
2008
IEEE
— The telecom and the internet world is converging towards all-IP network architecture and the operators are keen to provide innovative multimedia services coupled with advanced ...
ISSTA
2006
ACM
14 years 1 months ago
2006
ACM
Test campaigns usually require only a restricted subset of paths in a program to be thoroughly tested. As random testing (RT) offers interesting fault-detection capacities at low ...