112 search results - page 15 / 23 » Test generation in VLSI circuits for crosstalk noise |
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
GLVLSI
2009
IEEE
14 years 2 months ago
2009
IEEE
A synthetic noise function is a key component of most computer graphics rendering systems. This pseudo-random noise function is used to create a wide variety of natural looking te...
DELTA
2006
IEEE
14 years 1 months ago
2006
IEEE
In high speed digital circuits, the inductive effect is more dominant compared to capacitive effect. In particular, as the technology is shrinking, the spacing between interconnec...
GLVLSI
2002
IEEE
14 years 18 days ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
VTS
2002
IEEE
14 years 16 days ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...