502 search results - page 5 / 101 » Test pattern generation based on arithmetic operations |
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compat...
ICCAD
1998
IEEE
14 years 24 days ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
VTS
1995
IEEE
14 years 2 days ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
TAP
2010
Springer
13 years 6 months ago
2010
Springer
We present QuickSpec, a tool that automatically generates algebraic specifications for sets of pure functions. The tool is based on testing, rather than static analysis or theorem ...