137 search results - page 6 / 28 » Test purpose generation in an industrial application |
IFIP
2001
Springer
13 years 12 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
EVOW
2001
Springer
13 years 12 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
KBSE
2007
IEEE
14 years 1 months ago
2007
IEEE
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
CORR
2007
Springer
13 years 7 months ago
2007
Springer
This paper presents a methodology to efficiently explore the design space of communication adapters. In most digital signal processing (DSP) applications, the overall performance ...
DAC
2003
ACM
14 years 19 days ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...