22 search results - page 3 / 5 » Test-Sequence Generation with Hol-TestGen with an Applicatio... |
ICCAD
1997
IEEE
13 years 11 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
IIWAS
2008
13 years 9 months ago
2008
Distributed development of software has turned into a natural and modern approach where teams spread over the world cooperate to develop a software product, and this has become po...
JSS
2008
13 years 7 months ago
2008
Search-based test-data generation has proved successful for code-level testing but almost no search-based work has been carried out at evels of abstraction. In this paper the appl...