283 search results - page 17 / 57 » Testing CPU emulators |
100
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ITC
1991
IEEE
15 years 6 months ago
1991
IEEE
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
100
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GLVLSI
2007
IEEE
15 years 8 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
162
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GLVLSI
2009
IEEE
15 years 8 days ago
2009
IEEE
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...
127
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VLSID
2007
IEEE
16 years 2 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
ITC
1997
IEEE
15 years 6 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...