244 search results - page 11 / 49 » Testing Digital Circuits with Constraints |
EUSFLAT
2003
13 years 10 months ago
2003
Industrial processes can be often modelled using Petri nets. If all the process variables (or events) are assumed to be twovalued signals, then it is possible to obtain a hardware...
ASPDAC
2008
ACM
13 years 10 months ago
2008
ACM
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructe...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurement...
ET
2010
13 years 6 months ago
2010
Modern mixed-signal/RF circuits with a digital calibration capability could achieve significant performance improvement through calibration. However, the calibration process often ...
DSD
2005
IEEE
14 years 2 months ago
2005
IEEE
We describe a new e-learning environment and a runtime platform for educational tools on digital system testing and design for testability. This environment is being developed in ...