244 search results - page 39 / 49 » Testing Digital Circuits with Constraints |
ICCAD
2003
IEEE
14 years 5 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
DAC
2005
ACM
13 years 10 months ago
2005
ACM
We present BonnPlace, a new VLSI placement algorithm that combines the advantages of analytical and partitioning-based placers. Based on (non-disjoint) placements minimizing the t...
MTDT
2003
IEEE
14 years 1 months ago
2003
IEEE
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
IJCNN
2000
IEEE
14 years 1 months ago
2000
IEEE
This paper shows an application in the field of Electronic CAD of the Selfish Gene algorithm, an evolutionary algorithm based on a recent interpretation of the Darwinian theory. Te...