244 search results - page 40 / 49 » Testing Digital Circuits with Constraints |
ICCAD
2007
IEEE
14 years 14 days ago
2007
IEEE
This paper addresses the design of multi-mode architectures for digital signal processing applications. We present a dedicated design flow and its associated high-level synthesis t...
GIS
2011
ACM
13 years 2 days ago
2011
ACM
Data conflation is a major issue in GIS: different geospatial data sets covering overlapping regions, possibly obtained from different sources and using different acquisition ...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
TVLSI
2008
13 years 8 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
FPGA
2009
ACM
14 years 3 months ago
2009
ACM
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...