The proposed work involves conversion of a given circuit model into a set of constraints and employing constraint solvers to generate tests for it. The method is demonstrated for ...
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...