244 search results - page 5 / 49 » Testing Digital Circuits with Constraints |
TVLSI
2008
13 years 8 months ago
2008
The proposed work involves conversion of a given circuit model into a set of constraints and employing constraint solvers to generate tests for it. The method is demonstrated for ...
CORR
2011
Springer
13 years 3 months ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
ITC
1995
IEEE
14 years 4 days ago
1995
IEEE
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
CONSTRAINTS
2007
13 years 8 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...