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DAC
2007
ACM
14 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2005
ACM
14 years 10 months ago
Designing logic circuits for probabilistic computation in the presence of noise
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
ICFP
2005
ACM
14 years 9 months ago
Acute: high-level programming language design for distributed computation
Existing languages provide good support for typeful programming of standalone programs. In a distributed system, however, there may be interaction between multiple instances of ma...
Peter Sewell, James J. Leifer, Keith Wansbrough, F...
ICSE
2010
IEEE-ACM
14 years 2 months ago
From behaviour preservation to behaviour modification: constraint-based mutant generation
The efficacy of mutation analysis depends heavily on its capability to mutate programs in such a way that they remain executable and exhibit deviating behaviour. Whereas the forme...
Friedrich Steimann, Andreas Thies
ICSM
1994
IEEE
14 years 1 months ago
A Framework for Partial Data Flow Analysis
Although data pow analysis was first developed for use in compilers, its usefulness is now recognized in many software tools. Because of its compiler origins, the computation of d...
Rajiv Gupta, Mary Lou Soffa