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VTS
2003
IEEE
119views Hardware» more  VTS 2003»
15 years 9 months ago
Test Data Compression Using Dictionaries with Fixed-Length Indices
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
Lei Li, Krishnendu Chakrabarty
ITC
1993
IEEE
148views Hardware» more  ITC 1993»
15 years 8 months ago
DELTEST: Deterministic Test Generation for Gate-Delay Faults
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
Udo Mahlstedt
135
Voted
APPROX
2009
Springer
137views Algorithms» more  APPROX 2009»
15 years 10 months ago
Testing Computability by Width Two OBDDs
Property testing is concerned with deciding whether an object (e.g. a graph or a function) has a certain property or is “far” (for some definition of far) from every object w...
Dana Ron, Gilad Tsur
ATS
2003
IEEE
131views Hardware» more  ATS 2003»
15 years 9 months ago
Software-Based Delay Fault Testing of Processor Cores
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...
Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hi...
ICSE
2007
IEEE-ACM
16 years 4 months ago
Regression Test Selection for AspectJ Software
As aspect-oriented software development gains popularity, there is growing interest in using aspects to implement cross-cutting concerns in object-oriented systems. When aspect-or...
Guoqing Xu, Atanas Rountev