2169 search results - page 213 / 434 » Testing Incremental Adaptation |
137
Voted
GLVLSI
2005
IEEE
15 years 8 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
97
Voted
DATE
2010
IEEE
15 years 7 months ago
2010
IEEE
—The admission control problem is concerned with determining whether a new task may be accepted by a system consisting of a set of running tasks, such that the already admitted a...
140
Voted
ET
2010
14 years 12 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
117
Voted
HIPEAC
2009
Springer
15 years 9 months ago
2009
Springer
Process variations, which lead to timing and power variations across identically-designed components, have been identified as one of the key future design challenges by the semico...
134
Voted
ICCS
2009
Springer
15 years 9 months ago
2009
Springer
Abstract. A framework for a fully implicit solution method is implemented into (1) the High Order Methods Modeling Environment (HOMME), which is a spectral element dynamical core o...