In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in System-on-achip (SoC) environments. The approach advantages are the ab...
Paolo Bernardi, Guido Masera, Federico Quaglio, Ma...
In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza ...
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
Graham Hetherington, Tony Fryars, Nagesh Tamarapal...
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...
Bradley F. Dutton, Mustafa Ali, Charles E. Stroud,...