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MUC
1995
15 years 6 months ago
SRI International FASTUS system: MUC-6 test results and analysis
Douglas E. Appelt, Jerry R. Hobbs, John Bear, Davi...
VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
15 years 6 months ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
76
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MUC
1991
15 years 6 months ago
New York University PROTEUS system: MUC-3 test results and analysis
Ralph Grishman, John Sterling, Catherine Macleod