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MUC
1995
14 years 20 days ago
SRI International FASTUS system: MUC-6 test results and analysis
Douglas E. Appelt, Jerry R. Hobbs, John Bear, Davi...
VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
14 years 20 days ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...