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97
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DAC
2001
ACM
16 years 3 months ago
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
Li Chen, Xiaoliang Bai, Sujit Dey
135
Voted
TASE
2009
IEEE
15 years 9 months ago
Fault-Based Test Case Generation for Component Connectors
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
Bernhard K. Aichernig, Farhad Arbab, Lacramioara A...
140
Voted
SEFM
2007
IEEE
15 years 8 months ago
Protocol Conformance Testing a SIP Registrar: an Industrial Application of Formal Methods
Various research prototypes and a well-founded theory of model based testing (MBT) suggests the application of MBT to real-world problems. In this article we report on applying th...
Bernhard K. Aichernig, Bernhard Peischl, Martin We...
121
Voted
ADAEUROPE
2001
Springer
15 years 7 months ago
Testing from Formal Specifications, a Generic Approach
Deriving test cases from specifications is now recognised as a major application of formal methods to software development. Several methods have been proposed for various formalism...
Marie-Claude Gaudel
ECOOP
2000
Springer
15 years 6 months ago
Automated Test Case Generation from Dynamic Models
We have recently shown how use cases can be systematically transformed into UML state charts considering all relevant information from a use case specification, including pre- and ...
Peter Fröhlich, Johannes Link