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ICCAD
1998
IEEE
96views Hardware» more  ICCAD 1998»
15 years 6 months ago
Test set compaction algorithms for combinational circuits
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
Ilker Hamzaoglu, Janak H. Patel
CISSE
2008
Springer
15 years 4 months ago
Knowledge Assessment - Practical Example in Testing
: Knowledge assessment is inseparable part of current e-learning technologies. It can be used for self-assessment of students to give them feedback about their progress in a study ...
Ján Genci
100
Voted
HCI
2007
15 years 4 months ago
Differences in Task Descriptions in the Think Aloud Test
This paper analyzes and discusses the ways tasks are described and perceived in a remote Think Aloud (TA) usability tests session. The paper includes reports from a study and the p...
Lene Nielsen, Sameer Chavan
BIOSIG
2003
89views Biometrics» more  BIOSIG 2003»
15 years 4 months ago
How to Test the Performance of Speech Verifiers and Statistical Evaluation
Abstract: Biometric identification and verification technologies, in the past, have promised high performance levels. Such performance statements lead to the assumption, that these...
Jörg Tacke, Andreas Wolf
123
Voted
DICTA
2003
15 years 3 months ago
Testing for Curves in a Binary Image
Abstract. Curve detection is viewed as a process of hypothesis generation and hypothesis testing. Of the two, hypothesis generation has received much attention and many sophisticat...
Y. C. Cheng