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SAC
1997
ACM
15 years 5 months ago
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
ITC
1994
IEEE
136views Hardware» more  ITC 1994»
15 years 5 months ago
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
ET
2008
93views more  ET 2008»
15 years 2 months ago
Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique
Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury...