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ITC
1994
IEEE
136views Hardware» more  ITC 1994»
14 years 1 months ago
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
ET
2008
93views more  ET 2008»
13 years 10 months ago
Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique
Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury...