1610 search results - page 34 / 322 » Testing Patterns |
KDD
2004
ACM
14 years 10 months ago
2004
ACM
Analyzing data to find trends, correlations, and stable patterns is an important task in many industrial applications. This paper proposes a new technique based on parallel coordi...
ET
2002
13 years 9 months ago
2002
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
ICCD
2002
IEEE
14 years 7 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
GI
2001
Springer
14 years 2 months ago
2001
Springer
We present a pragmatic approach using formal methods to increase the quality of distributed component based systems: Based on UML class diagrams annotated with OCL constraints, co...