1610 search results - page 41 / 322 » Testing Patterns |
ATS
2009
IEEE
14 years 4 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
IWCMC
2006
ACM
14 years 4 months ago
2006
ACM
Wireless sensors use low power radio transceivers due to the stringent constraints on battery capacity. As a result, radio transmission with wireless sensors is unreliable. Furthe...
CP
2009
Springer
14 years 10 months ago
2009
Springer
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
ETS
2006
IEEE
14 years 4 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
ITC
1995
IEEE
14 years 1 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...