1610 search results - page 63 / 322 » Testing Patterns |
DELTA
2008
IEEE
14 years 4 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
ER
2000
Springer
14 years 1 months ago
2000
Springer
: The size and complexity of modern information systems together with requirements for short development time increase the demands for reuse of already existing solutions. The idea...
BIRD
2008
Springer
14 years 3 days ago
2008
Springer
The Edinburgh Mouse Atlas aims to capture in-situ gene expression patterns in a common spatial framework. In this study, we construct a grammar to define spatial regions by combina...
DSD
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
DAGM
2004
Springer
14 years 3 months ago
2004
Springer
In this paper we present a new method for self-localization on wafers using geometric hashing. The proposed technique is robust to image changes induced by process variations, as o...