359 search results - page 17 / 72 » Testing Periodicity |
SEKE
2009
Springer
14 years 3 months ago
2009
Springer
Most existing software optimization research assumes advance knowledge of the component parameters. Perfect future knowledge of fault detection is an unnecessary oversimpliļ¬cati...
DFT
1999
IEEE
14 years 27 days ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
WSC
2007
13 years 11 months ago
2007
Combat, unlike many real-world processes, tends to be singular in nature. That is, there are not multiple occurrences from which to hypothesize a probability distribution model of...
VLSID
2001
IEEE
14 years 9 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ISSA
2008
13 years 10 months ago
2008
This paper replicates and extends Observed Trends in Spam Construction Techniques: A Case Study of Spam Evolution. A corpus of 169,274 spam email was collected over a period of fi...