1554 search results - page 66 / 311 » Testing Polymorphic Behavior |
FMCAD
2007
Springer
14 years 2 months ago
2007
Springer
— The concept of applying partial fencing to logic built-in self test (LBIST) hardware structures for the purpose of using partially good chips is well known in the chip design i...
ETS
2011
IEEE
12 years 8 months ago
2011
IEEE
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
ITC
1999
IEEE
14 years 14 days ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
ASWEC
2010
IEEE
13 years 8 months ago
2010
IEEE
—A quality-driven approach to software development and testing demands that, ultimately, the requirements of stakeholders be validated against the actual behavior of an implement...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper describes a novel test method for continuous-time adaptive equalizers. This technique applies a two-sinusoidal-tone signal as stimulus and includes an RMS detector for ...