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VTS
1999
IEEE
71views Hardware» more  VTS 1999»
15 years 6 months ago
Test Generation for Ground Bounce in Internal Logic Circuitry
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer
WSC
2008
15 years 4 months ago
A methodology for unit testing actors in proprietary discrete event based simulations
CT This paper presents a dependency injection based, unit testing methodology for unit testing components, or actors, involved in discrete event based computer network simulation v...
Mark E. Coyne, Scott R. Graham, Kenneth M. Hopkins...
TII
2008
109views more  TII 2008»
15 years 2 months ago
Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
ICASSP
2008
IEEE
15 years 8 months ago
Composite hypothesis testing by optimally distinguishable distributions
Relying on optimally distinguishable distributions (ODD), it was defined very recently a new framework for the composite hypothesis testing. We resort to the linear model to inve...
Seyed Alireza Razavi, Ciprian Doru Giurcaneanu
119
Voted
MTDT
2002
IEEE
129views Hardware» more  MTDT 2002»
15 years 7 months ago
March SS: A Test for All Static Simple RAM Faults
This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industria...
Said Hamdioui, A. J. van de Goor, Mike Rodgers