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DATE
2009
IEEE
151views Hardware» more  DATE 2009»
14 years 2 months ago
pTest: An adaptive testing tool for concurrent software on embedded multicore processors
—More and more processor manufacturers have launched embedded multicore processors for consumer electronics products because such processors provide high performance and low powe...
Shou-Wei Chang, Kun-Yuan Hsieh, Jenq Kuen Lee
JIPS
2010
107views more  JIPS 2010»
13 years 2 months ago
Incremental Model-based Test Suite Reduction with Formal Concept Analysis
Test scenarios can be derived based on some system models for requirements validation purposes. Model-based test suite reduction aims to provide a smaller set of test scenarios whi...
Pin Ng, Richard Y. K. Fung, Ray W. M. Kong
AOSD
2008
ACM
13 years 9 months ago
AspectT: aspect-oriented test case instantiation
e instantiation is the transformation of abstract test cases cutable test scripts. Abstract test cases are either created during model based test case generation or are manually d...
Sebastian Benz
DATE
2005
IEEE
119views Hardware» more  DATE 2005»
14 years 1 months ago
On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...
Sandeep Kumar Goel, Erik Jan Marinissen
COMPSAC
2009
IEEE
13 years 5 months ago
Towards Call for Testing: An Application to User Acceptance Testing of Web Applications
1 The paper proposes a new test model, Call-For-Testing (CFT), and applies it to User Acceptance Testing (UAT) of Web Applications. Different from traditional approaches, UAT in th...
Lian Yu, Wei Zhao, Xiaofeng Di, Changzhu Kong, Wen...