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ICCAD
1994
IEEE
87views Hardware» more  ICCAD 1994»
13 years 12 months ago
On testing delay faults in macro-based combinational circuits
We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...
Irith Pomeranz, Sudhakar M. Reddy
ECMDAFA
2006
Springer
107views Hardware» more  ECMDAFA 2006»
13 years 11 months ago
Mutation Analysis Testing for Model Transformations
In MDE, model transformations should be efficiently tested so that it may be used and reused safely. Mutation analysis is an efficient technique to evaluate the quality of test dat...
Jean-Marie Mottu, Benoit Baudry, Yves Le Traon
CAV
2010
Springer
179views Hardware» more  CAV 2010»
13 years 11 months ago
Generating Litmus Tests for Contrasting Memory Consistency Models
Well-defined memory consistency models are necessary for writing correct parallel software. Developing and understanding formal specifications of hardware memory models is a chal...
Sela Mador-Haim, Rajeev Alur, Milo M. K. Martin
CSDA
2007
88views more  CSDA 2007»
13 years 7 months ago
A study of partial F tests for multiple linear regression models
Partial F tests play a central role in model selections in multiple linear regression models. This paper studies the partial F tests from the view point of simultaneous confidence...
Mortaza Jamshidian, Robert I. Jennrich, Wei Liu
AICT
2006
IEEE
100views Communications» more  AICT 2006»
14 years 1 months ago
A Concept Model for Computer-based Spoken Language Tests
Spoken language education plays an important role in modern language courses. Computer-based spoken language test systems provide a convenient, efficient and reliable approach to ...
Yijian Wu, Wenyun Zhao, Xin Peng, Yunjiao Xue