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ICSE
2008
IEEE-ACM
14 years 11 months ago
The effect of program and model structure on mc/dc test adequacy coverage
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
SOFSEM
2010
Springer
14 years 5 months ago
Model-Driven Software Product Line Testing: An Integrated Approach
Andy Schürr, Sebastian Oster, Florian Markert
ATAL
2009
Springer
14 years 4 months ago
Model based testing for agent systems
Zhiyong Zhang, John Thangarajah, Lin Padgham
CPAIOR
2009
Springer
14 years 4 months ago
Using Model Counting to Find Optimal Distinguishing Tests
Stefan Heinz, Martin Sachenbacher
FMICS
2009
Springer
14 years 4 months ago
Model-Based Testing of Electronic Passports
Wojciech Mostowski, Erik Poll, Julien Schmaltz, Ja...