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» Testing Semantics: Connecting Processes and Process Logics
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103
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ITC
2000
IEEE
104views Hardware» more  ITC 2000»
15 years 8 months ago
Application of deterministic logic BIST on industrial circuits
We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...
Gundolf Kiefer, Hans-Joachim Wunderlich, Harald P....
123
Voted
DATE
2005
IEEE
127views Hardware» more  DATE 2005»
15 years 9 months ago
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
160
Voted
ICDE
2002
IEEE
103views Database» more  ICDE 2002»
15 years 8 months ago
Using Unity to Semi-Automatically Integrate Relational Schema
Unity is an architecture for integrating relational databases that performs three processes: metadata capture, semantic integration, and query formulation and execution. The found...
Ramon Lawrence, Ken Barker
147
Voted
KI
2002
Springer
15 years 3 months ago
Description Logics for the Semantic Web
The vision of a Semantic Web has recently drawn considerable attention, both from academia and industry. Description Logics are often named as one of the tools that can support th...
Franz Baader, Ian Horrocks, Ulrike Sattler
142
Voted
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 7 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka