Abstract-- Single-ended static random access memory (SESRAM) is well known for their tremendous potential of low active power and leakage dissipations. In this paper, we present a ...
Jawar Singh, Jimson Mathew, Saraju P. Mohanty, Dhi...
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
Brooks R. Garrison, Daniel T. Milton, Charles E. S...
Abstract. Algorithms dealing with massive data sets are usually designed for I/O-efficiency, often captured by the I/O model by Aggarwal and Vitter. Another aspect of dealing with ...
Programs written in languages that provide direct access to memory through pointers often contain memory-related faults, which may cause non-deterministic failures and even securi...
James A. Clause, Ioannis Doudalis, Alessandro Orso...