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VTS
2003
IEEE
95views Hardware» more  VTS 2003»
14 years 23 days ago
Built-In Reseeding for Serial Bist
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
Ahmad A. Al-Yamani, Edward J. McCluskey
ISSRE
2000
IEEE
13 years 12 months ago
Evaluation of Regressive Methods for Automated Generation of Test Trajectories
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
Brian J. Taylor, Bojan Cukic
ERSHOV
2003
Springer
14 years 22 days ago
Integration of Functional and Timed Testing of Real-Time and Concurrent Systems
The article presents an approach to model based testing of complex systems based on a generalization of finite state machines (FSM) and input output state machines (IOSM). The app...
Victor V. Kuliamin, Alexandre Petrenko, Nick V. Pa...
ATVA
2006
Springer
102views Hardware» more  ATVA 2006»
13 years 11 months ago
A Semantic Framework for Test Coverage
Abstract. Since testing is inherently incomplete, test selection is of vital importance. Coverage measures evaluate the quality of a test suite and help the tester select test case...
Laura Brandán Briones, Ed Brinksma, Mari&eu...
MBEES
2008
13 years 9 months ago
Composition of Model-based Test Coverage Criteria
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
Mario Friske, Bernd-Holger Schlingloff, Stephan We...