306 search results - page 4 / 62 » Testing additive integrality gaps |
IJCCBS
2010
13 years 6 months ago
2010
: The overall safety integrity of a safety critical system, comprising both software and hardware, is typically specified quantitatively, e.g., in terms of failure rates. However, ...
SE
2007
13 years 9 months ago
2007
: Developing and maintaining large software systems can require the usage of a variety of different automatic test tools. The complexity of the tools leads to considerable overhead...
NAACL
2010
13 years 5 months ago
2010
I briefly describe a system for automatically creating an implemented grammar of a natural language based on answers to a web-based questionnaire, then present a grammar of Sahapt...
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
VTS
2002
IEEE
14 years 12 days ago
2002
IEEE
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...