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ICSE
2003
IEEE-ACM
14 years 1 months ago
Data Flow Testing as Model Checking
This paper presents a model checking-based approach to data flow testing. We characterize data flow oriented coverage criteria in temporal logic such that the problem of test ge...
Hyoung Seok Hong, Sung Deok Cha, Insup Lee, Oleg S...
MTDT
2000
IEEE
137views Hardware» more  MTDT 2000»
14 years 6 days ago
Diagnostic Testing of Embedded Memories Based on Output Tracing
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...
DAC
1997
ACM
14 years 12 hour ago
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
HASE
2007
IEEE
13 years 11 months ago
Model Validation using Automatically Generated Requirements-Based Tests
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
DATE
2004
IEEE
174views Hardware» more  DATE 2004»
13 years 11 months ago
Graph-Based Functional Test Program Generation for Pipelined Processors
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
Prabhat Mishra, Nikil Dutt