A method of using Markov chain techniques for combinatorial test case selection is presented. The method can be used for statistical and coverage testing of many software programs...
Sergiy A. Vilkomir, W. Thomas Swain, Jesse H. Poor...
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
Theresa Maudie, Alex Hardt, Rick Nielsen, Dennis S...
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
Harald P. E. Vranken, Friedrich Hapke, Soenke Rogg...
The use of techniques for automating the generation of software test cases is very important as it can reduce the time and cost of this process. The latest methods for automatic g...