6941 search results - page 156 / 1389 » Testing as a Certification Approach |
116
Voted
ITNG
2008
IEEE
15 years 9 months ago
2008
IEEE
A method of using Markov chain techniques for combinatorial test case selection is presented. The method can be used for statistical and coverage testing of many software programs...
117
Voted
ETS
2006
IEEE
15 years 8 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
84
Voted
ITC
2003
IEEE
15 years 8 months ago
2003
IEEE
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
103
Voted
ITC
2003
IEEE
15 years 8 months ago
2003
IEEE
This paper presents an approach for reducing the test data volume that has to be stored in ATE vector memory for IC manufacturing testing. We exploit the capabilities of present A...
131
Voted
KBSE
2003
IEEE
15 years 8 months ago
2003
IEEE
The use of techniques for automating the generation of software test cases is very important as it can reduce the time and cost of this process. The latest methods for automatic g...