6941 search results - page 190 / 1389 » Testing as a Certification Approach |
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
— Being able to test the intrinsic performance of a device under test (DUT) has always been the main goal of a test engineer. Achieving this goal is becoming increasingly diffic...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that runlength c...
GPCE
2003
Springer
14 years 1 months ago
2003
Springer
A primary goal of generative programming and model-driven ent is to raise the level of abstraction at which designers and developers interact with the software systems they are bui...
ITC
1993
IEEE
14 years 5 days ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...